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Digital Circuit Testing and Testability cover
  • ISBN: 9780124343306
  • ISBN10: 0124343309

Digital Circuit Testing and Testability

by Lala, Parag K. A Lala

  • List Price: $83.95
  • Binding: Hardcover
  • Publisher: Academic Press
  • Publish date: 01/01/1997
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Description
In the past few years, reliable hardware system design has become increasingly important in the computer industry. Digital Circuit Testing and Testability is an easy to use introduction to the practices and techniques in this field.
-- Contains the most up-to-date information on fault modeling in CMOS devices
-- Provides comprehensive coverage of self-checking logic design at the gate and the transistor level
-- Discusses the latest techniques available for testing state machines
-- Presents a collection of methods for testable logic synthesis
-- Provides state-of-the-art information on Built-in-self-testing
-- Includes detailed coverage of memory testing
-- Discusses all major techniques for fault-tolerant hardware design
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HPB Inc.

Location: Dallas, TX
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Connecting readers with great books since 1972. Used books may not include
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$26.91
Bob's Book Journey

Location: Austin, TX
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8vo-over 7¾"-9¾" tall. Hardcover, xii, 199 pp. Moderate wear at corners and ends of spine, unmarked, tight binding.
$28.12