Information Control in Manufacturing 1998 (Incom '98) Advances in Industrial Engineering a Proceedings Volume from the 9th Ifac Symposium, Nancy-Met
- List Price: $275.00
- Binding: Paperback
- Publisher: Elsevier Science Ltd
- Publish date: 12/01/1998
Description:
Volume 1. Inaugural Session. Plenary I: Advanced Automation Engineering. Industrial Applications of Petri Nets. Worldwide Grafcet. Control of Hybrid Systems. Formal Verification for Automation Engineering. Theories for Advanced Control Systems. Control System Engineering. Plenary II: Emerging Technology for Advanced Manufacturing. Microrobotics and Microsystems. C.A.P.P.: Computer Aided Process Planning. Mechatronics: Co-Design of Software and Hardware. Flexible Manufacturing Systems. Advanced Technologies. Product and Manufacturing Cell Engineering. Plenary III: Information Technology for Integration in Manufacturing. Industrial Communication Systems. Petri Nets for Scheduling Manufacturing Systems. Scheduling. Production Planning. Concurrent Engineering. Plenary IV: Intelligent Manufacturing and Process System Engineering. Volume 2. Design of Distributed Architectures by the Interconnection of Intelligent Components. Multi-Agent Manufacturing Systems. Fuzzy Information Engineering I. Fuzzy Information Engineering II. Intelligent Manufacturing System Engineering. Plenary V: Management of Advanced Industrial Systems. Joint Design of Technology and Organisation. Integrated Design: From Theory to Practice. Educational Engineering for Engineers Training. Towards Virtual Reality for Advanced Technology Management. Enterprise Engineering I. Enterprise Engineering II. Manufacturing System Management: Models and Methods. Plenary VI: Industrial Safety, Dependability and Quality. Control Reconfiguration. Process Fault Diagnosis. Economical and Technical Aspects in Industrial Maintenance. Design of Automated Production Systems: Principles of Safety Integration. Integration of Dependability in the Design Process of Production Automated Systems. Quality Dependability and Fault Tolerance. Author index.
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