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Digital Circuit Testing and Testability

by Lala, Parag K. A Lala

  • ISBN: 9780124343306
  • ISBN10: 0124343309

Digital Circuit Testing and Testability

by Lala, Parag K. A Lala

  • List Price: $83.95
  • Binding: Hardcover
  • Publisher: Academic Press
  • Publish date: 01/01/1997
  • ISBN: 9780124343306
  • ISBN10: 0124343309
used Add to Cart $62.98
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Product notice Returnable at the third party seller's discretion and may come without consumable supplements like access codes, CD's, or workbooks.
Description: In the past few years, reliable hardware system design has become increasingly important in the computer industry. Digital Circuit Testing and Testability is an easy to use introduction to the practices and techniques in this field.
-- Contains the most up-to-date information on fault modeling in CMOS devices
-- Provides comprehensive coverage of self-checking logic design at the gate and the transistor level
-- Discusses the latest techniques available for testing state machines
-- Presents a collection of methods for testable logic synthesis
-- Provides state-of-the-art information on Built-in-self-testing
-- Includes detailed coverage of memory testing
-- Discusses all major techniques for fault-tolerant hardware design
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Product notice Returnable at the third party seller's discretion and may come without consumable supplements like access codes, CD's, or workbooks.
Seller Condition Comments Price  
Seller: True Oak Books
Location: Highland, NY
Condition: Very Good
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0124343309. Light foxing to the exterior edge of pages only. Great overall
[...]
Price:
$62.98
Comments:
0124343309. Light foxing to the exterior edge of pages only. Great overall
[...]
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