More and more chips are being designed with both analog and digital circuitry next to each other, which makes testing analog circuitry even more challenging. This comprehensive guide reviews all the potential testing options, helping designers, engineers, CAD developers and researchers choose the most cost-effective, accurate solutions for both mixed-signal and analog-only testing.

The book begins by outlining current research in analog test, and discussing both major alternatives: specification-based test and fault model based test. Next, it reviews fault modeling in detail, notably inductive fault analysis. The book includes a tutorial survey of current fault simulation and test generation techniques for analog and mixed-signal circuits. Other equally detailed coverage includes: design for test techniques; spectral-based built-in self test methods; the new board-level analog test standard; and testing switched-current circuits.