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Arithmetic Built-In Self-Test for Embedded Systems

by Rajski, Janusz

  • ISBN: 9780137564385
  • ISBN10: 0137564384

Arithmetic Built-In Self-Test for Embedded Systems

by Rajski, Janusz

  • List Price: $89.00
  • Binding: Hardcover
  • Publisher: Prentice Hall
  • Publish date: 01/01/2009
  • ISBN: 9780137564385
  • ISBN10: 0137564384
used Add to Cart $27.33
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Description: A detailed reference to new training concepts and techniques for circuit and system design.
-- The most thorough treatment of Arithmetic built-in-self-test (BIST) available from one of the field's most well-known researchers.
-- Critical information for VLSI system design and testing.
-- Includes introductory information for those new to BIST.

This book will introduce test and design engineers to new techniques that can be used to improve testing and quality of a wide range of circuits.

This book explains what arithmetic built-in self-test (BIST) is, and how it can be used in a wide variety of circuits. It shows how BIST can support new design methodologies that rely on hardware/software co-design, DSP cores and embedded processors.

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Ships from Reno, NV. Former Library book. Great condition for a used book!
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Ships from Reno, NV. Former Library book. Great condition for a used book!
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