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Characterization Methods for Submicron Mosfets

by Hisham Haddara

Characterization Methods for Submicron Mosfets cover
  • ISBN: 9780792396956
  • ISBN10: 0792396952

Characterization Methods for Submicron Mosfets

by Hisham Haddara

  • List Price: $219.99
  • Binding: Hardcover
  • Publisher: Kluwer Academic Pub
  • Publish date: 01/01/1996
  • ISBN: 9780792396956
  • ISBN10: 0792396952
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Description: Preface. 1. Static Measurements and Parameter Extraction. 2. Small Signal Characterization of VLSI MOSFETs. 3. Charge Pumping. 4. Deep Level Transient Spectroscopy. 5. Individual Interface Traps and Telegraph Noise. 6. Characterization of SOI MOSFETs. 7. Modern Analog IC Characterization Techniques. Index.
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