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Design for At-Speed Test, Diagnosis and Measurement

by Benoit Nadeau-Dostie

ISBN: 9780792386698
ISBN10: 0792386698

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Design for At-Speed Test, Diagnosis and Measurement

by Benoit Nadeau-Dostie

List Price: $219.99
Binding: Hardcover
Publisher: Kluwer Academic Pub
Publish date: 09/01/1999
ISBN: 9780792386698
ISBN10: 0792386698

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Product notice May come without consumable supplements like access codes, CD's, or workbooks.

Description: Technology Overview.- Memory Test and Diagnosis.- Logic Test and Diagnosis.- Embedded Test Design Flow.- Hierarchical Core Test.- Test and Measurement for PLLs and ADCs.- System Test and Diagnosis.- System Reuse of Embedded Test.

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Error title

Design for At-Speed Test, Diagnosis and Measurement

by Benoit Nadeau-Dostie

Design for At-Speed Test, Diagnosis and Measurement

by Benoit Nadeau-Dostie

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