Electromigration and Electronic Device Degradation
- List Price: $277.95
- Binding: Hardcover
- Edition: 1
- Publisher: John Wiley & Sons Inc
- Publish date: 01/01/1994
Description:
Reliability and Electromigration Degradation of GaAs MicrowaveMonolithic Integrated Circuits (A. Christou). Simulation and Computer Models for Electromigration (P.Tang). Temperature Dependencies on Electromigration (M. Pecht & P.Lall). Electromigration and Related Failure Mechanisms in VLSIMetallizations (A. Christou & M. Peckerar). Metallic Electromigration Phenomena (S. Krumbein). Theoretical and Experimental Study of Electromigration (J.Zhao). GaAs on Silicon Performance and Reliability (P. Panayotatos, etal.). Electromigration and Stability of Multilayer Metal-SemiconductorSystems on GaAs (A. Christou). Electrothermomigration Theory and Experiments in Aluminum Thin FilmMetallizations (A. Christou). Reliable Metallization for VLSI (M. Peckerar). Index.
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