Description:
This is a book about the integrity of sealed packages to resist foreign gases and liquids penetrating the seal or an opening (crack) in the package -- especially critical to the reliability and longevity of electronics. The author explains leak rate measurements and the assumptions of impurities. The book gathers in a single volume a great many issues previously available only in journals -- or only in the experience of working engineers and provides an analysis of nearly 100 problems representative of daily challenges.
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