Iddq Testing of Vlsi Circuits
- List Price: $139.00
- Binding: Hardcover
- Publisher: Kluwer Academic Pub
- Publish date: 01/01/1993
Description:
IDDQ Testing: A Review.- Iddq Testing as a Component of a Test Suite: The Need for Several Fault Coverage Metrics.- Iddq Testing in CMOS Digital ASICs.- Reliability Benefits of IDDQ.- Quiescent Current Analysis and Experimentation of Defective CMOS Circuits.- QUIETEST: A Methodology for Selecting IDDQ Test Vectors.- Generation and Evaluation of Current and Logic Tests for Switch-Level Sequential Circuits.- Diagnosis of Leakage Faults with IDDQ.- Algorithms for IDDQ Measurement Based Diagnosis of Bridging Faults.- Proportional BIC Sensor for Current Testing.- Design of ICs Applying Built-in Current Testing.
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