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Impact of Electron and Scanning Probe Microscopy on Materials Research

by Ugo Valdre

  • ISBN: 9780792359395
  • ISBN10: 0792359399

Impact of Electron and Scanning Probe Microscopy on Materials Research

by Ugo Valdre

  • List Price: $359.00
  • Binding: Hardcover
  • Publisher: Kluwer Academic Pub
  • Publish date: 08/01/1999
  • ISBN: 9780792359395
  • ISBN10: 0792359399
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Description: The impact of electron microscopy on materials research.- Microstructural design and tayloring of advanced materials.- Nanostructured materials.- Characterization of heterophase transformation interfaces by high-resolution transmission electron microscope techniques.- High resolution scanning electron microscopy observations of nano-ceramics.- Metal-ceramic interfaces studied with high resolution transmission electron microscopy.- Z-contrast scanning transmission electron microscopy.- Electron energy loss spectrometry in the electron microscope - Part 1: Introduction.- Electron energy loss spectrometry in the electron microscope - Part 2: EELS in the context of solid state spectroscopies.- Electron energy loss spectrometry in the electron microscope - Part 3: Interfaces and localised spectrometry.- EELS near edge structures. Application to intermetallic alloys and other materials.- Surface chemistiy and microstructure analysis of novel technological materials.- Convergent beam electron diffraction.- New developments in scanning probe microscopy.- Low-energy scanning electron microscope for nanolithography.- Application of low voltage Scanning Electron Microscopy and energy dispersive x-ray spectroscopy.- Environmental SEM and related applications. History of the environmental SEM and basic design concepts.- Environmental SEM and related applications. Gas interactions and gaseous amplification.- Environmental SEM and related applications. Applications.- ESEM image contrast and applications to wet organic materials.- Advanced electron and scanning probe microscopy on dental and medical materials research.- Correlative microscopy and probing in materials science.- Epilogue.
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