Description: This book deals with the application of finely focused high-energy ion beams in materials characterization, and how they turn ion beam spectrometry into ion beam microscopy. The text includes fundamental principles in crystallography and solid-state physics, as well as the current state of the art in MeV ion optics - all of which play an important role in this technology. Along with in-depth coverage of the various processes involved in nuclear microscopy and ion-solid interactions, the book explores nuclear microprobe hardware in detail, examines various applications of nuclear microprobes for materials analysis, and considers all experimental aspects of using these new analytical methods. The authors draw on their work at the pioneering nuclear microprobe facilities at Oxford and Melbourne Universities. They share their insight and knowledge throughout and help simplify many complex problems that arise when focusing MeV ion beams down to submicron spots, or when dealing with the vast amount of data these experiments yield. Their discussion of ion beam analysis techniques is accessible and useful, addressing in particular the needs of materials scientists in a wide range of fields, while also providing information of more general appeal to other scientists involved in ion beam work. It also demonstrates how conventional and widely applied ion beam analysis with unfocused beams can be enormously enhanced by use of a focused beam. In addition to its complete and up-to-date treatment of the subject, Materials Analysis Using a Nuclear Microprobe affords us a glimpse of the future - pointing in the direction this technology is going, showing the influence it is bound to have on the workdone in laboratories worldwide, and suggesting the new possibilities this will open up for a variety of ion beam applications.

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