Scanning Force Microscopy With Applications to Electric, Magnetic and Atomic Forces
- Binding: Hardcover
- Edition: 2
- Publisher: Oxford Univ Pr on Demand
- Publish date: 08/01/1994
Description:
This edition updates the survey of the many rapidly developing subjects concerning the mapping of a variety of forces across surfaces, including basic theory, instrumentation, and applications. It also includes important new research in STM and a thoroughly revised bibliography.
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Product notice
Returnable at the third party seller's discretion and may come without consumable supplements like access codes, CD's, or workbooks.
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